News Releases

Registration Opens for Next Testing Phase of IEEE Certified Biometrics Professional Program

13 January – IEEE, the world’s largest technical professional association, today announced that enrollment for the next testing phase of its Certified Biometrics Professional™ (CBP) program is now open. Testing windows for 2010 are scheduled for April 24 to May 31 and November 20 to December 31, with corresponding registration periods open from January 11 to May 26 and from August 9 to December 28, respectively.

IEEE and some of the world’s leading biometrics experts developed the new program to help meet training, hiring and evaluation needs of professionals and organizations throughout the biometrics industry. The IEEE CBP program focuses on the relevant knowledge and skills necessary to apply biometrics to real-world challenges and applications.

“We strongly encourage the biometrics community to get involved in the next test group of this important program,” said Matthew S. Loeb, staff executive, IEEE. “The IEEE CBP program provides the industry with an unbiased measure of the baseline level of knowledge held by an individual, and is a by-product of the evolving field of biometrics and the growth this industry has seen over the last 10 to 15 years.”