Home > Conferences & Events > Conference Details
CMOS Devices Technology, Characterization, Reliability and Yield, Displays, sensors and displays, memory technology, modeling and simulation, process technology, solid state and nanoelectronic devices.
05 Dec - 07 Dec 2011
Hilton Washington and Towers
Washington, DC, USA
Ms. Phyllis W. Mahoney
IEDM
Widerkehr & Associates
19803 Laurel Valley Place
US Montgomery Village MD 20886
+1 301 527 0900
+1 301 527 0994 (fax)
phyllism@widerkehr.com
11124
1500
Please see the conference Web site for full details.
Search for call for papers on conference site
Abstract submission deadline: 24 Jun 2011