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2011 IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability (ASTR)

IEEE sponsors:

  • IEEE Components, Packaging and Manufacturing Technology Society
  • IEEE Engineering in Medicine and Biology Society

Accelreated stress test techniques and case studies related to accelerated stress testing.

 

Conference Details

Dates

12 Oct - 14 Oct 2011

 

Location

San Francisco Sheraton at the Wharf
San Francisco, CA, USA

 

Web site

 

Contact

Dennis Pachucki
1080 Summerview Dr
San Jose CA USA 95132
+1 408 251 9779
+1 408 309 5206
dpachucki@comcast.net

 

Conference #

17777

 

Attendance

100

 

 

Please see the conference Web site for full details.

Call for Papers for Conference Authors

Find details for paper and abstract submission.

Abstract submission deadline: 20 Jan 2011

Final submission deadline: 20 May 2011

Notification of acceptance date: 21 Mar 2011

 

 

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