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2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)

IEEE sponsors:

  • IEEE Electron Devices Society

This conference focuses on new developments in test structures, as well as their implementation and/or application, related to silicon, semiconductors, nanotechnology and MEMS. Suggested topics include Material and Process Characterization, Device and Circuit Modeling, Parameter Extraction, Yield Enhancement and Production Process Control and so on.

 

Conference Details

Dates

25 Mar - 28 Mar 2013

 

Location

Osaka University Nakanoshima Center
Osaka, Japan

 

Web site

 

Contact

Tatsuya Ohguro
8, Shinsugita-Cho, Isogo-ku
Toshiba Corporation
Semiconductor & Storage Products Company
Yokohama Japan 235-8522
+81 45 776 5697
+81 90 6514 748
tatsuya.ooguro@toshiba.co.jp
+81 45 776 4104 (fax)

 

Conference #

21133

 

Attendance

100

 

Publications

 

 

Please see the conference Web site for full details.

Call for Papers for Conference Authors

Find details for paper and abstract submission.

Abstract submission deadline: 21 Sep 2012

Final submission deadline: 14 Jan 2013

Notification of acceptance date: 14 Nov 2012

 

 

Features

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