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Home  >  Conferences & Events  >  Conference Details

2013 IEEE International Test Conference (ITC)

International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems. At ITC, design, test, and yield professionals can confront the challenges the industry faces, and learn how these challenges are being addressed.

 

Conference Details

Dates

06 Sep - 13 Sep 2013

 

Location

Disney Resort Destinations
1150 W. Magic Way
Anaheim, CA, USA

 

Web site

 

Contact

Gordon Roberts
McGill University
Dept. Electrical & Computer Engineering
3480 University Street
Montreal QC Canada H4X 1T7
+001-514-398-6029
gordon.roberts@mcgill.ca
+001-514-398-4470 (fax)

 

Conference #

30169

 

Attendance

3000

 

Publications

 

 

Please see the conference Web site for full details.

Call for Papers for Conference Authors

Find details for paper and abstract submission.

Abstract submission deadline: 14 Feb 2013

Final submission deadline: 09 Aug 2013

Notification of acceptance date: 01 May 2013

 

 

Features

  • Exhibits
  • Tutorials