International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems. At ITC, design, test, and yield professionals can confront the challenges the industry faces, and learn how these challenges are being addressed.
06 Sep - 13 Sep 2013
Disney Resort Destinations
1150 W. Magic Way
Anaheim, CA, USA
Dept. Electrical & Computer Engineering
3480 University Street
Montreal QC Canada H4X 1T7
Please see the conference Web site for full details.
Abstract submission deadline: 14 Feb 2013
Final submission deadline: 09 Aug 2013
Notification of acceptance date: 01 May 2013