2013 IEEE 22nd North Atlantic Test Workshop (NATW)

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. The 22nd NATW will feature a half day tutorial on Wednesday titled VLSI Test and Security. In addition to traditional topics, the 22nd NATW will feature a general theme of Growing importance of Test and Hardware Security. Topics are not limited to, the following: Analog, Mixed Signal & RF Testing Built-In Self-Test (BIST) Board Level Testing Delay & Performance Testing Design Verification/Validation Diagnosis and Debug Fault Modeling/Simulation FPGA & Embedded Core Testing IDDQ Testing DFM, Defect Analysis & Defect-Based Testing Multi-Chip Module Testing Memory & MEMS Testing Nanotechnology Testing Online Testing System-on-Chip (SOC) Test & Debug Test Quality/System Reliability Test Resource Partitioning Testing for Soft Errors/Defects