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2013 IEEE 22nd North Atlantic Test Workshop (NATW)

IEEE sponsors:

  • Boston Section
  • Green Mountain Section

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. The 22nd NATW will feature a half day tutorial on Wednesday titled “VLSI Test and Security.” In addition to traditional topics, the 22nd NATW will feature a general theme of “Growing importance of Test and Hardware Security.” Topics are not limited to, the following: Analog, Mixed Signal & RF Testing Built-In Self-Test (BIST) Board Level Testing Delay & Performance Testing Design Verification/Validation Diagnosis and Debug Fault Modeling/Simulation FPGA & Embedded Core Testing IDDQ Testing DFM, Defect Analysis & Defect-Based Testing Multi-Chip Module Testing Memory & MEMS Testing Nanotechnology Testing Online Testing System-on-Chip (SOC) Test & Debug Test Quality/System Reliability Test Resource Partitioning Testing for Soft Errors/Defects


Conference Details


08 May - 10 May 2013



Sheraton Colonial Boston North Hotel & Conference Center
1 Audubon Road
Wakefield, MA, USA


Web site



Robert Alongi
One Centre Street, Suite 203
IEEE Boston Section
Wakefield MA USA 01880
781 245 5405


Conference #







Please see the conference Web site for full details.

Call for Papers for Conference Authors

Find details for paper and abstract submission.

Abstract submission deadline: 15 Feb 2013

Final submission deadline: 19 Apr 2013

Notification of acceptance date: 29 Mar 2013