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2013 IEEE 22nd North Atlantic Test Workshop (NATW)

IEEE sponsors:

  • Boston Section
  • Green Mountain Section

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. The 22nd NATW will feature a half day tutorial on Wednesday titled “VLSI Test and Security.” In addition to traditional topics, the 22nd NATW will feature a general theme of “Growing importance of Test and Hardware Security.” Topics are not limited to, the following: Analog, Mixed Signal & RF Testing Built-In Self-Test (BIST) Board Level Testing Delay & Performance Testing Design Verification/Validation Diagnosis and Debug Fault Modeling/Simulation FPGA & Embedded Core Testing IDDQ Testing DFM, Defect Analysis & Defect-Based Testing Multi-Chip Module Testing Memory & MEMS Testing Nanotechnology Testing Online Testing System-on-Chip (SOC) Test & Debug Test Quality/System Reliability Test Resource Partitioning Testing for Soft Errors/Defects

 

Conference Details

Dates

08 May - 10 May 2013

 

Location

Sheraton Colonial Boston North Hotel & Conference Center
1 Audubon Road
Wakefield, MA, USA

 

Web site

 

Contact

RobertAlongi
One Centre Street, Suite 203
IEEE Boston Section
Wakefield MA USA 01880
781 245 5405
r.alongi@ieee.org

 

Conference #

31139

 

Attendance

35

 

 

Please see the conference Web site for full details.

Call for Papers for Conference Authors

Find details for paper and abstract submission.

Abstract submission deadline: 15 Feb 2013

Final submission deadline: 19 Apr 2013

Notification of acceptance date: 29 Mar 2013