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EDS Announces the Appointment of a New Editor-in-Chief (EIC) for its Newsletter
Our EDS Newsletter
has reached a crossroads. After many
distinguished years of service, Krishna Shenai is stepping down
as founding Editor-in-Chief (EIC). Under his stewardship, the
new EDS Newsletter was created in 1994. In the past seven years,
the Newsletter has improved dramatically with increased coverage
of chapters and reporting of EDS activity around the world making
it the premier vehicle for members to keep in touch with society
news and events. It has been a pleasure to work with Krishna and
his Editors. This year, besides Krishna, Mikael Ostling, S.C.
Sun, Chuck Yarling, Paul Yu & Stephen Parke are also departing
the Editorial Board. The entire AdCom, and all EDS members wish
them the best, and our gratitude for a job well done. In turn,
we should also look forward with anticipation to the new Newsletter
EIC, Ninoslav Stojadinovic (whose bio follows), and his new Associates,
Murty Polavarapu, Sunit Tyagi, Alexander Gridchin, and Andrzej
Napieralski. Nino becomes our first non-U.S. EIC and should bring
a new and unique perspective to the position. It is also timely
since the Piscataway office will also be more involved with automated
submissions and author relations. Thus, the Newsletter with a
new EIC, new Editors, and a new editorial look embarks on a different
path. We owe Krishna and his team our thanks for their contributions
and improvements, as the Newsletter enters a new era under Ninòs
care. It should be an exciting time. Ninoslav D. Stojadinovic was born in Nis,
Yugoslavia, in 1950. He received the Dipl. Ing., M. Sc. and D.
Sc. degrees, all in electrical engineering, from the Faculty of
Electronic Engineering, University of Nis, in 1974, 1977 and 1980,
respectively. In 1974, he joined the Ei-Semiconductors,
Nis, where he worked on R&D of bipolar semiconductor devices,
such as low-voltage Zener diodes, hyper-abrupt varicap diodes
and planar bipolar transistors. In 1976, he joined the Faculty
of Electronic Engineering, University of Nis, where he is now
Professor and Head of the Department of Microelectronics. His
current research interest involves various aspects of MOS devices
and circuits, ranging from device physics and modeling, process
and device simulation, and characterization and reliability. He
is a distinguished lecturer of the IEEE Electron Devices Society
for the area of microelectronics reliability. He is the author
or co-author of 58 papers in refereed international journals and
120 papers for international and national conferences. He was
the supervisor of more than 40 Dipl. Ing. theses, 10 M. Sc. theses
and 11 D. Sc. theses in the field of microelectronics. Dr. Stojadinovic was an Editor-in-Chief of
the Microelectronics Journal
and Regional Editor of the IEEE
EDS Newsletter. Currently, he is an
Editor-in-Chief of Microelectronics
Reliability journal and a member
of the International Advisory Board of the Journal
of Semiconductor Technology and Science.
He is also the Programme Committee Chairman of the IEEE International
Conference on Microelectronics (MIEL). He is the Chair of the
Yugoslavia IEEE Section and Chair of the Yugoslavia IEEE ED/SSC
Chapter. Dr. Stojadinovic is President of the Yugoslav
Society of Electronics, Telecommunications, Computers, Automation
and Nuclear Engineering (ETRAN) and Corresponding Member of Yugoslav
Academy of Engineering. John K. Lowell |