The EMC Society has many
distinguished members that deserve to be featured in the EMC Personality
Profile column. For example, our Fellows deserve recognition.
The IEEE Fellow status is granted to members with an extraordinary
record of accomplishments in one of the IEEE designated fields
of interest. The IEEE Board of Directors confers the honor.
In 2005, the EMC Society had four members (Dr. Bruce Archambeault,
Professor Heyno Garbe, Dr. Todd Hubing, and John Osburn) elected
to the Fellow Grade. These four new Fellows are featured in the
EMC Personality Profile in this issue of the EMC Newsletter.
Dr. Bruce Archambeault
Dr.
Archambeault was elected to the Fellow grade “for leadership
in and application of numerical modeling for product EMI compliance
and understanding of EMI coupling paths.” Bruce received
a Bachelors degree from the University of New Hampshire, a master’s
degree from Northeastern University and a doctor’s degree
from the University of New Hampshire. Bruce worked for Digital
Equipment Corporation in the 1990 time frame and he began looking
for a way to apply computational electromagnetic (EM) modeling
to provide an understanding of EMI coupling and radiation mechanisms.
The goal was to achieve EMI compliance without so many retrofits
and re-designs of a product. At that time, the complexity of a
printed circuit design and its enclosure went well beyond the
available computational resources. This remains true today. The
challenge in computational EMI modeling is to reduce the complexity
of the design to those features that affect the radiation and
the EMI coupling paths. Dr. Archambeault made two significant
contributions. First, through research, he developed a basic understanding
of EMI coupling paths. Second, he used this basic understanding
to reduce the complexity of circuits and their enclosures so computational
EM modeling could be applied. Bruce has used the results of his
efforts to develop a systematic approach to EMI compliance. He
taught this approach throughout IBM (his present employer), and
as a result, compliance has been achieved with minimum retrofits
on the first design validation prototype. Bruce has distributed
his computational design process throughout the EMC design community
through workshops, tutorials, books, conference papers and short
courses. He is active in the IEEE EMC Society and has received
a number of awards for his work.
Professor Heyno Garbe
Professor
Garbe was elected to the Fellow grade “for contributions
to the analysis and standardization of EMC measurement techniques
with TEM waveguides.” Heyno received bachelor, master and
PhD degrees from the University of the Federal Armed Forces in
Hamburg, Germany. Professor Garbe is a technical leader and innovator
in the development of TEM waveguide test methodology that provides
low cost, repeatable EMC susceptibility testing as compared to
more expensive open area test site, shielded room or anechoic
chamber facilities. Professor Garbe’s efforts focused on:
- The development of analytic models for
TEM waveguides;
- The characterization of loaded TEM waveguides;
- The advancement of statistical methods
to insure homogeneity of electric field strength for repeatable
measurements;
- The deployment of depolarization angle
criteria for determining the presence of a TEM mode; and
- Leading the Joint Task Force CISPRA/A
and TC77 on TEM waveguides that was responsible for the recently
published IEC 61000-4-20.
Professor Garbe is a
renowned engineering educator. In 1998, he was appointed Dean
for Education in the Department of Electrical Engineering and
Information Technology at the University of Hanover, Germany.
Heyno has been very active in the EMC Society. He was instrumental
in the formation of the German EMC Chapter in 1994. Since 1997
he has served as the Chapter Chairman. As a result of his efforts
to improve Chapter activities, the German Chapter received the
EMC Society Chapter of the Year Award in 2001. In addition to
his chapter activities, he has acted as an Associate Editor of
the IEEE Transactions on EMC. In 2003, the EMC Society honored
Dr. Garbe by presenting the Laurence G. Cumming Award for Outstanding
Service and Leadership to him.
Dr. Todd Hubing
Dr.
Hubing was elected to the Fellow grade “for contributions
to numerical electromagnetic modeling of printed circuit boards
and enhancing the understanding of EMC and electromagnetic phenomena.”
Todd received a BEE degree from the Massachusetts Institute of
Technology, a MEE from Purdue University and a PhD (EE) from North
Carolina University. Dr. Hubing is recognized as a leading authority
in the advancement and novel application of computational electromagnetics
(CEM) for solving real world EMC problems. He began his career
more than 20 years ago when he joined the Radiation Engineering
Laboratory at IBM in Research Triangle Park. At IBM, he contributed
to the development of dozens of new products including networking
equipment, communications products, and some of the earlier personal
computers. His primary responsibility was making sure that these
products met EMC requirements. As a graduate student at North
Carolina State University, he developed an interest in CEM modeling
and was one of the first to apply a full wave numerical modeling
technique to predict an EMI problem with an actual product under
development. In 1989, Todd left IBM to join the University of
Missouri – Rolla (UMR) where he was a leader in establishing
the UMR EMC laboratory. The lab became a valuable source for information
on CEM. Currently, Todd is responsible for several important technological
developments that have had a significant impact on EMC. These
include the development of:
-
Novel mathematical/computer models for efficiently locating
EMI problems in printed circuit board designs and estimating
their impact on radiated EMI tests;
-
New techniques for modeling and analysis of embedded capacitance;
and
-
Development of the voltage-driven/current-driven concept for
characterizing sources of common-mode currents.
Todd has been an active
supporter of the EMC Society. He has co-authored 37 journal publications
and more than 100 conference papers. Todd was President of the
EMC Society in 2002 and 2003.
John Osburn
John
Osburn was elected to the Fellow Grade “for contribution
to education of the Electromagnetic Environmental Effects (E3)
community and pioneering the development of new EMC test technology.”
John received a Bachelors Degree from the University of Texas
at Austin and a Masters Degree from the University of Southern
California. He has worked in the EMI/EMC technology area, primarily
as a technical team leader responsible for defining the requirements
and establishing procedures for resolving a myriad of real world
EMI problems. He has developed several EMI/EMC courses. He was
the lead instructor of a TEMPEST design course and he developed
the TEMPEST facilities design course, for which he received a
letter of commendation from the National Security Agency (NSA)
in 1986. He has directed almost 100 MIL-STD-461/2 and TEMPEST
tests and more than 300 commercial EMC tests. In the early 1990s,
John helped pioneer the development of new techniques (facilities
and instrumentation) to perform accurate electromagnetic shielding
measurements. He was the technical lead of the development team
at EMCO responsible for the original production of the Gigahertz
Transverse Electromagnetic (GTEM) chamber, which is considered
to be one of the industry standards in EM measurement facilities.
During the 1980s, John led engineering teams that used one of
the first EMC analysis computer programs for analyzing large complex
systems. This included the Intrasystem Electromagnetic Compatibility
Analysis Program (IEMCAP). John has been active in the EMC Society
as Chairman of the 1997 IEEE International Symposium on EMC. He
also served as Vice Chairman of the Central Texas Chapter and
Chairman of the Denver Chapter of the EMC Society. EMC
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