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Submitted by
Teresa Farris, Vice-Chairperson of Publicity
2000 IEEE NUCLEAR AND SPACE
RADIATION EFFECTS CONFERENCE
Outstanding
Conference
Paper Awards
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The recipients of the 2000 NSREC Outstanding Conference Paper Award are Paul Dodd, Marty Shaneyfelt, Dave Walsh, Jim Schwank, Gerald Hash, Rhonda Loemker, Bruce Draper, and Peter Winokur, all of Sandia National Laboratories, for their paper entitled “Single-Event Upset and Snapback in Silicon-on-Insulator Devices”. In this paper, the authors explored the performance of silicon-on-insulator (SOI) devices in heavy ion environments, using a combination of focused ion microbeam experiments, 3D numerical simulations, and broadbeam accelerator testing. Using 3D charge- collection simulations, the authors showed the importance of bipolar amplification in SOI transistors and predicted that body ties must be kept very close to the transistor channel to prevent single-event snapback (SES). Focused ion microbeam experiments confirmed the presence of SES in single-transistor SOI test structures.
The Meritorious Conference Paper Award for NSREC-2000 was given to Joe Srour and Daniel Lo of TRW for their paper entitled “Universal Damage Factor for Radiation-Induced Dark Current in Silicon Devices”. Both the Outstanding and Meritorious Papers were published in the December 2000 issue of the IEEE Transactions on Nuclear Science.
The Radiation Effects Data Workshop provides a forum for the presentation of radiation response and test facility data of interest to members of the community, while the Workshop Record serves as a ready reference for detailed radiation effects data. This year, two 2000 REDW poster presentations were selected as Outstanding REDW Presentations. The first award-winning presentation is entitled “Radiation Damage and Single Event Effect Results for Candidate Spacecraft Electronics” and provides a compendium of test results for a wide variety of electronic devices. This presentation’s authors are Martha O’Bryan, Christina Seidleck and Martin Carts, Raytheon; Kenneth LaBel, Robert Reed, Janet Barth, Cheryl Marshall, Donald Hawkins and Anthony Sanders, NASA/GSFC; James Howard, Jr., Hak Kim and James Forney, Jackson and Tull; Ray Ladbury and Scott Kniffin, Orbital Sciences; Paul Marshall, Consultant; David Roth, James Kinnison and Elbert Nhan, Applied Physics Laboratory; and Kusum Sahu, QSS.
The second Outstanding REDW Presentation is entitled “A Compendium of Recent Optocoupler Radiation Test Data” and was written by Kenneth LaBel, Robert Reed and Cheryl Marshall, NASA/GSFC; Scott Kniffin and Ray Ladbury, Orbital Sciences; Hak Kim and James W. Howard, Jr., Jackson and Tull; Jerry Wert, Dennis Oberg and Eugene Normand, Boeing; Allan Johnston, JPL; Gary Lum, Lockheed Martin; Rocky Koga and Susan Crain, Aerospace Corporation; James Schwank and Gerald Hash, Sandia National Laboratories; Steve Buchner, James Mann and Larry Simpkins, NRL; Mary D’Ordine, Ball Aerospace; and Martha O’Bryan, Christina Seidleck, Loc Nguyen and Martin Carts, Raytheon. This presentation covers radiation test results from many organizations on optocouplers, a class of devices that is of increasing interest to system designers.
The many authors on both presentations show evidence of the cooperation between the broad range of organizations they represent.