38TH ANNUAL INTERNATIONAL NUCLEAR AND SPACE RADIATION EFFECTS
CONFERENCE
Vancouver, B.C., Canada
July 16-20, 2001
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On behalf of the NPSS Radiation Effects Committee, it is our pleasure to invite you to attend and participate in the 38th Annual International Nuclear and Space Radiation Effects Conference (NSREC) to be held July 16-20, 2001, at the award-winning Westin Bayshore Resort & Marina in Vancouver, B.C., Canada. The 2001 Conference will continue the tradition of previous NSRECs by offering an outstanding technical program, a one-day Short Course preceding the technical program, a Radiation Effects Data Workshop, and an Industrial Exhibit. We expect attendance by engineers, scientists, managers, and other interested persons from many nations. The 2001 NSRE Conference Committee has been busy working to ensure that this Conference will be regarded as one of the most technically beneficial and socially rewarding conferences. We are excited about this year’s Conference and look forward to seeing you in Vancouver. Highlights of the Conference are given below; complete details are provided at www.nsrec.com.
The conference is sponsored by the IEEE Nuclear and Plasma Science Society’s Radiation Effects Committee and supported by the Defense Threat Reduction Agency, Sandia National Laboratories, Air Force Research Laboratory, Jet Propulsion Laboratory, and NASA Goddard.
SHORT COURSE
Attendees will have the opportunity to participate in a one-day Short Course on Monday, July 16. A Short Course is offered each year and is intended to provide newcomers with an overview and in-depth study of timely and significant issues in the radiation effects field and for updating and refreshing the knowledge of experienced workers. The theme of this year’s Short Course, organized by Paul Dodd (Sandia National Laboratories), is “Radiation Effects in Advanced Microelectronics: Issues for SOI, Bipolar, and CMOS Technologies.” The Short Course will start with a morning devoted to silicon-on-insulator (SOI) technology. This important technology has been used in hardened systems for some time and is finally starting to emerge in the commercial marketplace. The afternoon will focus on radiation effects issues relevant to advanced bipolar and CMOS technologies.
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| Marty Shaneyfelt General Chair |
Janet Barth Technical Chair |
Joe Benedetto Local Arrangements |
Paul Dodd Short Course Chair |
Prof. Jean-Pierre Colinge of University of California at Davis will present the segment on Silicon-on-Insulator Technology: Overview and Device Physics. Prof. Colinge is a recognized expert in the field of SOI technology and will cover the basics of SOI transistor design, device physics, and substrate types to bring us all up to speed on what “makes SOI tick.” He will also cover the unique performance and power advantages that are making SOI an attractive choice for advanced commercial technologies.
Dr. Olivier Musseau and Dr. Veronique Ferlet-Cavrois of CEA-DAM will present the segment on Silicon-on-Insulator Technology: Radiation Effects. With a solid background on SOI operation in normal environments behind us, Drs. Musseau and Ferlet-Cavrois will cover the specifics of radiation effects in SOI devices and circuits. This section of the course will include SOI performance from a perspective of both total dose and single-event effects, and how technology choices made by manufacturers of SOI integrated circuits (e.g., body-tied vs. floating body designs) may affect radiation hardness.
Prof. Ron Schrimpf of Vanderbilt University will present the segment on Physics and Hardness Assurance for Bipolar Technologies. Prof. Schrimpf will discuss radiation effects and hardness assurance issues for advanced bipolar technologies. This has been a topic of a great deal of recent interest following the discovery of enhanced total-dose degradation in low dose rate environments. Methods of hardness assurance and the physical mechanisms on which they are based will be presented.
Dr. Steve Buchner of SFA/NRL and Mr. Mark Baze of Boeing will co-present the final segment on Single-Event Transients and Measurement Techniques. Dr. Buchner and Mr. Baze will bring us up to speed on the topic of single-event transients in high-speed circuits. Single-event transients (SETs) are expected to become a serious concern with increasing clock speeds in advanced commercial technologies. Topics of discussion will include measurement techniques for studying SET, and circuit design methodologies for preventing their propagation.
For those interested in Continuing Education Units (CEUs), there will be an open-book test at the end of the course. The course is valued at 0.6 CEUs and endorsed by the IEEE and the International Association for Education and Training.
TECHNICAL INFORMATION
The Technical Program Chairwoman, Janet Barth (NASA Goddard), and her program committee have put together an exceptional set of contributed papers that have been arranged into 9 sessions of 52 oral and 34 poster papers, and a Radiation Effects Data Workshop. The Radiation Effects Data Workshop consists of 23 papers emphasizing radiation effects data on electronic devices and systems and descriptions of new simulation and radiation test facilities. In addition, there are three outstanding invited talks that should be of general interest to attendees and their companions.
List of technical sessions:
INVITED TALKS
Since the turn of the century, society has relied heavily on electricity for meeting essential needs. Three large, interconnected grids that span the North American continent provide rapid response to the diverse energy demands of users in the United States and Canada. This unique energy service requires coordination of electrical supply, demand, and delivery – all occurring at the speed of light. The sprawling North American grid resembles a large antenna, attracting electrical currents induced by giant solar storms. During severe space weather conditions, these solar storms have the potential to cause large-scale blackouts in North America by disrupting transmission grid operations. The disruptions can literally occur any time over the entire 11-year solar cycle. On Wednesday (July 18) Mr. Kappenman of METATEK will describe how accurate forecasts of a storm’s onset, duration, and magnitude are achieved using satellite technology. Included will be a discussion on why power grids are increasingly vulnerable to economic and natural forces.
On Thursday (July 19) Dr. Alan Shotter, one of Europe’s top researchers in the field of nuclear physics using accelerated beams of exotic ions, will speak about using radioactive beams to explore reactions which take place on stars, in particular explosive burning in supernova, to produce the elements above helium. He leads investigations at the Tri-University Meson Facility’s (TRIUMF’s) new world-class facility called ISAC (Isotope Accelerator) which produces radioactive beams of 3,000 isotopes to study the types of reactions that take place in the stars. As the new Director of the TRIUMF facility, Dr. Shotter will lead the Canadian effort to exploit the ISAC.
Mr. Cary Wolinsky, an author and photographer for National Geographic, will give us a behind-the-scenes look at the process of producing those amazing National Geographic Magazine stories and breathtaking photographs on Friday (July 20). He will discuss where the ideas come from, what really goes on during the field trips, and how a story works its way through the National Geographic article-making apparatus toward ink on paper. He will share with us his experiences and inspirations to get that one photograph that “tells the story”. Along the way we will visit Russia, Australia, and space through his marvelous photography.
INDUSTRIAL EXHIBIT
This year’s Industrial Exhibit, organized by Darrell Craig (Peregrine Semiconductor), will permit one-on-one discussions between conference attendees and exhibitors on the latest in radiation-hardened electronic devices, radiation analysis and testing services, and radiation test facilities and test equipment. We will kick-off the start of the Industrial Exhibit with a reception on Monday evening for attendees and their guests. If you would like to participate in the exhibit, or need more information on the exhibit, please visit www.nsrec.com or contact Darrell Craig, the 2001 NSREC Industrial Exhibits Chairman. Current listing of companies exhibiting at 2001 NSREC:
Actel
Aeroflex UTMC
AFRL/USBX
Amptek Inc.
ATMEL
BAE Systems
Bell Technologies
Boeing Space Systems
Boeing Radiation Effects Lab
Cyclotron (Texas A & M)
Defense Microelectronic Activity
Honeywell
Integrated Systems Engineering, Inc.
International Rectifier
Intersil Corporation
iROC Technologies
J. D. Instruments
J. L. Shepherd
Mission Research Corporation
NASA Goddard Space Flight Center
Northrop Grumman
Peregrine Semiconductor Corporation
Sandia National Laboratories
Xilinx, Inc.
SOCIAL PROGRAM
Social events have been planned to give Conference attendees and their guests opportunities to informally discuss radiation effects and to become better acquainted. Joe Benedetto (Aeroflex UTMC), this year’s Local Arrangements Chairman, has put together a memorable social program. The highlight of the program will be the Wednesday evening social where attendees and their companions will have the opportunity to take a dinner cruise along English Bay. We strongly encourage you to register as early as possible for the social events as we are limited in the numbers we can accommodate.
Vancouver is situated amidst a magnificent natural harbor and the scenery is dominated by the North Shore Mountains. The weather in July is extremely pleasant. Vancouver and the surrounding area offer an unsurpassed assortment of recreational and cultural attractions for you and your family. As a result, Vancouver is an extremely popular place to visit in July. So do not delay, make your travel arrangements to attend this year’s Conference today! To make hotel reservations contact The Westin Bayshore Resort & Marina directly at +1 604 682-3377. You must indicate that you are with the “IEEE NSREC” to receive the conference rate.
ADDITIONAL INFORMATION
For the latest NSREC information (technical program, conference & social registration forms, hotel and travel information, etc.) please visit our web site at www.nsrec.com.
You may also contact either the General Chairman, Marty R. Shaneyfelt, Sandia National Laboratories, Albuquerque, NM 87185; Phone: +1 505 844-6137; Email: shaneymr@ sandia.gov.
Or the Publicity Chairwoman, Teresa Farris, Aeroflex UTMC, 4350 Centennial Blvd., Colo. Spgs., CO 80907; Phone: +1 719 594-8035; Fax +1 719 594-8468; E-mail: teresa.farris@utmc.aeroflex.com.