The long awaited “IEEE Standard Test Procedures for CZT and Other Wide-BandGap Semiconductor Detectors of Ionizing Radiation” (IEEE1557)" is well on the way to completing all hurdles and is expected to be issued in the near future.

IEEE Standard 325 “IEEE Standard Test Procedures for Germanium Gamma-Ray Detectors” is to be ballotted for reaffirmation shortly. At the same time, it will be reviewed for possible revision at a later date.

Louis Costrell, Secretary of NIDCom can be reached at the National Institute of Science and Technology, MS 8460, 100 Bureau Drive, B119, Gaiithersburg, MD  20899-8460; Phone +1 301 975- 5608; Fax: +1 301 869-7682; E-mail: louis.costrell@nist.gov