The
2003 IEEE Nuclear and Space Radiation Effects Conference will
be held July 21-25, 2003 in Monterey, California at the Doubletree
Hotel. The conference features a Technical Program consisting
of ten sessions of contributed papers that describe the latest
observations and research results in radiation effects, a Short
Course focusing on how device scaling impacts radiation effects
in space that will be presented on July 21, a Radiation Effects
Data Workshop, and an Industrial Exhibit. The Technical
Program includes oral and poster sessions.
This is the 40th year in
which the NSREC has been held. A special publication will be made
available to attendees that describes the major technical accomplishments
associated with work presented at the Conference over its forty-year
history.
Supporters include the Defense Threat
Reduction Agency, Sandia National Laboratories, Air Force Research
Laboratory, and the NASA Electronic Parts and Packaging Program.
TECHNICAL PROGRAM
Papers to be presented at this
meeting will describe the effects of space or nuclear radiation
on electronic or photonic devices, circuits, sensors, materials
and systems, as well as semiconductor processing technology and
techniques for producing radiation-tolerant devices and integrated
circuits. A new session has been added this year on terrestrial
radiation effects that is becoming an important problem for semiconductor
manufacturers for highly scaled devices. The Conference will be
attended by engineers, scientists and managers who are concerned
with radiation effects. International participation in the Conference
is strongly encouraged.
We are soliciting papers describing
significant new findings in the following or related areas:
Basic Mechanisms of Radiation
Effects in Electronic Materials and Devices
-
Ionizing radiation effects
-
Displacement damage effects
-
Radiation effects on materials
-
Single-event charge collection phenomena and
mechanisms
-
Processing-induced radiation effects
-
Radiation transport, energy deposition and
dosimetry
Radiation Effects on Electronic
and Photonic Devices and Circuits
-
MOS, bipolar and advanced technologies
-
SOI and SOS technologies
-
Optoelectronic and optical devices, and optical
systems
-
Novel devices structures, such as MEMS
-
Single-event effects
-
Modeling of devices, circuits and systems
-
Methods for hardened design and manufacturing
-
Radiation effects at cryogenic temperatures
-
Particle detectors and associated electronics
at high-energy accelerators
Space, Atmospheric and Terrestrial
Radiation Effects
Hardness Assurance Technology
and Radiation Testing
Radiation Effects on Commercial
Space Systems
New Developments of Interest
to the Radiation Effects Community
RADIATION EFFECTS
DATA WORKSHOP
The Radiation Effects Data Workshop
is a forum for papers on radiation effects data on electronic
devices and systems. Workshop papers are intended to provide radiation
response data to scientists and engineers who use electronic devices
in a radiation environment, and for designers of radiation-hardened
or radiation-tolerant systems. Papers describing new simulation
facilities are also welcomed.
PAPER SUBMITTAL
Information on the submission of summaries
to the 2003 NSREC for either the Technical Sessions or the Data
Workshop can be found at www.nsrec.com.
The deadline for submitting summaries is February 7, 2003.
SHORT COURSE
Attendees will have the opportunity
to participate in a one-day Short Course on Monday, July 21. We
are currently assemblying a short course that focuses on how scaling
and technical advances in microelectronics affects their use in
space. It will consist of four tutorial presentations that begin
with basic material, and develop a thorough understanding of how
advanced microelectronics are affected by radiation as well as
ways to select advanced microelectronics for space applications.
INDUSTRIAL EXHIBIT
An Industrial Exhibit will be included
as part of the Conference. The exhibit will be held on Tuesday
and Wednesday. It will include exhibits from 35-40 exhibitors
that represent companies or agencies involved in manufacturing
electronic devices or systems for applications in space or nuclear
environments, modeling and analysis of radiation effects at the
device and system level, and radiation testing.
CONFERENCE COMMITTEE
General Chair:
Allan
Johnston
Jet Propulsion Laboratory,
+1 818 354-6425
Technical Program:
Paul Dodd
Sandia National Laboratories
+1 505 844-1447
Local Arrangements:
Mark Hopkins
Aerospace Corporation
+1 515 872-6201
Short Course:
Joe Benedetto
Aeroflex UTMC
+1 719 594-8415
Publicity: Teresa
Farris
Aeroflex UTMC
+1 719 594-8035
Finance: Kay
Jobe
Boeing Satellite Systems
+1 310 416-3705
Awards: Gordon
Hopkinson
Sira Electro-Optics, Ltd. (UK)
44 20-8467-2636
Industrial Exhibits:
Howard Bogrow
Xilinx Inc.
+1 623 376-8692
Guest Editor:
Jim Kinnison
Johns Hopkins Applied Physics
Laboratory
+1 240 228-6169