CONFERENCES

2003 NSREC GEARING UP!

The 2003 IEEE Nuclear and Space Radiation Effects Conference will be held July 21-25, 2003 in Monterey, California at the Doubletree Hotel.  The conference features a Technical Program consisting of ten sessions of contributed papers that describe the latest observations and research results in radiation effects, a Short Course focusing on how device scaling impacts radiation effects in space that will be presented on July 21, a Radiation Effects Data Workshop, and an Industrial Exhibit.  The Technical Program includes oral and poster sessions.

This is the 40th year in which the NSREC has been held. A special publication will be made available to attendees that describes the major technical accomplishments associated with work presented at the Conference over its forty-year history.

Supporters include the Defense Threat Reduction Agency, Sandia National Laboratories, Air Force Research Laboratory, and the NASA Electronic Parts and Packaging Program.

TECHNICAL PROGRAM

Papers to be presented at this meeting will describe the effects of space or nuclear radiation on electronic or photonic devices, circuits, sensors, materials and systems, as well as semiconductor processing technology and techniques for producing radiation-tolerant devices and integrated circuits. A new session has been added this year on terrestrial radiation effects that is becoming an important problem for semiconductor manufacturers for highly scaled devices. The Conference will be attended by engineers, scientists and managers who are concerned with radiation effects. International participation in the Conference is strongly encouraged.

We are soliciting papers describing significant new findings in the following or related areas:

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

  • Ionizing radiation effects

  • Displacement damage effects

  • Radiation effects on materials

  • Single-event charge collection phenomena and mechanisms

  • Processing-induced radiation effects

  • Radiation transport, energy deposition and dosimetry

Radiation Effects on Electronic and Photonic Devices and Circuits

  • MOS, bipolar and advanced technologies

  • SOI and SOS technologies

  • Optoelectronic and optical devices, and optical systems

  • Novel devices structures, such as MEMS

  • Single-event effects

  • Modeling of devices, circuits and systems

  • Methods for hardened design and manufacturing

  • Radiation effects at cryogenic temperatures

  • Particle detectors and associated electronics at high-energy accelerators

Space, Atmospheric and Terrestrial Radiation Effects

  • Characterization and modeling of radiation environments

  • Space weather effects

  • Spacecraft charging

Hardness Assurance Technology and Radiation Testing

  • Testing techniques and guidelines

  • Hardness assurance methodology

Radiation Effects on Commercial Space Systems

New Developments of Interest to the Radiation Effects Community

RADIATION EFFECTS DATA WORKSHOP

The Radiation Effects Data Workshop is a forum for papers on radiation effects data on electronic devices and systems. Workshop papers are intended to provide radiation response data to scientists and engineers who use electronic devices in a radiation environment, and for designers of radiation-hardened or radiation-tolerant systems. Papers describing new simulation facilities are also welcomed.

PAPER SUBMITTAL

Information on the submission of summaries to the 2003 NSREC for either the Technical Sessions or the Data Workshop can be found at www.nsrec.com. The deadline for submitting summaries is February 7, 2003.

SHORT COURSE

Attendees will have the opportunity to participate in a one-day Short Course on Monday, July 21. We are currently assemblying a short course that focuses on how scaling and technical advances in microelectronics affects their use in space. It will consist of four tutorial presentations that begin with basic material, and develop a thorough understanding of how advanced microelectronics are affected by radiation as well as ways to select advanced microelectronics for space applications.

INDUSTRIAL EXHIBIT

An Industrial Exhibit will be included as part of the Conference. The exhibit will be held on Tuesday and Wednesday. It will include exhibits from 35-40 exhibitors that represent companies or agencies involved in manufacturing electronic devices or systems for applications in space or nuclear environments, modeling and analysis of radiation effects at the device and system level, and radiation testing.

CONFERENCE COMMITTEE

General Chair: Allan Johnston
Jet Propulsion Laboratory,
+1 818 354-6425

Technical Program:  Paul Dodd
Sandia National Laboratories
+1 505 844-1447

Local Arrangements:  Mark Hopkins
Aerospace Corporation
+1 515 872-6201

Short Course:  Joe Benedetto
Aeroflex UTMC
+1 719 594-8415

Publicity:  Teresa Farris
Aeroflex UTMC
+1 719 594-8035

Finance:  Kay Jobe
Boeing Satellite Systems
+1 310 416-3705

Awards:  Gordon Hopkinson
Sira Electro-Optics, Ltd. (UK)
44 20-8467-2636

Industrial Exhibits:  Howard Bogrow
Xilinx Inc.
+1 623 376-8692

Guest Editor:  Jim Kinnison
Johns Hopkins Applied Physics
Laboratory
+1 240 228-6169

 


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