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The 2005 IEEE Nuclear
and Space Radiation Effects Conference will be held July 11-15,
2005 in Seattle, Washington, at the Sheraton Seattle Towers and
Hotel. The conference features a Technical Program consisting of
ten sessions of contributed papers that describe the latest observations
and research results in radiation effects, a Short Course presented
on July 11 focusing on the implications of deep submicron scaling
on radiation effects, a Radiation Effects Data Workshop, and an
Industrial Exhibit. The Technical Program includes both oral and
poster sessions.
The conference hotel is conveniently located in downtown Seattle
at 6th and Pike Streets. A complete technical and social program
is being planned to maximize opportunities for information exchange
and networking in the area of radiation effects on microelectronic
and photonic devices, circuits, and systems. Supporters of the Conference
include the Defense Threat Reduction Agency, Sandia National Laboratories,
Air Force Research Laboratory, the NASA Electronic Parts and Packaging
Program, and the Jet Propulsion Laboratory.
TECHNICAL PROGRAM
Papers to be presented at this meeting will describe the effects
of space, terrestrial or nuclear radiation on electronic or photonic
devices, circuits, sensors, materials and systems, as well as semiconductor
processing technology and techniques for producing radiation-tolerant
devices and integrated circuits. The Conference will be attended
by engineers, scientists and managers who are concerned with radiation
effects. International participation in the Conference is strongly
encouraged.
We are soliciting papers describing significant new findings in
the following or related areas:
Basic Mechanisms of Radiation Effects in Electronic
Materials and Devices
- Ionizing radiation effects
- Displacement damage effects
- Radiation effects on materials
- Single-event charge collection phenomena and mechanisms
- Processing-induced radiation effects
- Radiation transport, energy deposition and dosimetry
Radiation Effects on Electronic and Photonic Devices
and Circuits
- MOS, bipolar and advanced technologies
- SOI and SOS technologies
- Optoelectronic and optical devices, and optical systems
- Novel devices structures, such as MEMS
- Single-event effects
- Modeling of effects on devices, circuits and systems
- Methods for hardened design and manufacturing
- Radiation effects at cryogenic temperatures
- Particle detectors and associated electronics at high-energy
accelerators
Space, Atmospheric and Terrestrial Radiation Effects
- Characterization and modeling of radiation environments
- Space weather effects
- Spacecraft charging
Hardness Assurance Technology and Radiation Testing
- Testing techniques and guidelines
- Hardness assurance
Radiation Effects on Commercial Space Systems
- New Developments of Interest to the Radiation Effects Community
RADIATION EFFECTS DATA WORKSHOP
The Radiation Effects Data Workshop is a forum for papers on radiation
effects data on electronic devices and systems. Workshop papers
are intended to provide radiation response data to scientists and
engineers who use electronic devices in a radiation environment,
and for designers of radiation-hardened or radiation-tolerant systems.
Papers describing new simulation facilities are also welcomed.
PAPER SUBMITTAL
Information on the submission of summaries to the 2005 NSREC for
either the Technical Sessions or the Data Workshop can be found
at www.nsrec.com. The deadline
for submitting summaries is February 4, 2005.
SHORT COURSE
Attendees will have the opportunity to participate in a one-day
Short Course on Monday, July 11. We are currently putting together
a short course that focuses on implications of deep submicron scaling
on radiation effects. It will consist of tutorial presentations
that begin with a review of the key issues and challenges of the
international semiconductor roadmap, and then moves to the implications
this holds for radiation effects, including terrestrial radiation
effects, single-event upset in highly scaled SOI, and single event
transients in analog ICs. The course will be of interest both to
radiation effects specialists and newcomers to the field alike.
INDUSTRIAL EXHIBIT
An Industrial Exhibit will be included as an integral part of the
Conference. The exhibit will be held on Tuesday and Wednesday. It
will include exhibits from 35-40 exhibitors that represent companies
or agencies involved in manufacturing electronic devices or systems
for applications in space or nuclear environments, modeling and
analysis of radiation effects at the device and system level, and
radiation testing.
CONFERENCE COMMITTEE
General Chair: Fred Sexton
Sandia National Laboratories,
(505) 844-3927
Technical Program: Mike Xapsos
NASA/GSFC,
(301) 286-2263
Short Course: Allan Johnston
Jet Propulsion Laboratories,
(818) 354-6425
Finance: Ron Lacoe
The Aerospace Corp,
(310) 336-0118
Local Arrangements: Kay Jobe
Boeing Space Systems,
(310) 416-3705
Publicity: Teresa Farris
Aeroflex,
(719) 594-8035
Awards: Jim Kinnison
Johns Hopkins/Applied Physics Laboratory,
(240) 228-6169
Industrial Exhibits: Nazik Maloyan
International Rectifier,
(310) 726-8412
Guest Editor: John Cressler
Georgia Tech,
(404) 894-5161
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