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The 2006 IEEE
Nuclear and Space Radiation Effects Conference will be held July
17-21, 2006 in Ponte Vedra Beach, Florida, at the Sawgrass Marriott
Resort and Spa. The conference features a Technical Program consisting
of eight to ten sessions of contributed papers that describe the
latest observations and research results in radiation effects, an
up-to-date Short Course offered on July 17, a Radiation Effects
Data Workshop, and an Industrial Exhibit. The Technical Program
includes both oral and poster sessions.
The conference hotel is located at Ponte Vedra Beach, Florida, which
is on the Atlantic coast between Jacksonville and St. Augustine.
A complete technical and social program is being planned to maximize
opportunities for information exchange and networking in the area
of radiation effects on microelectronic and photonic devices, circuits,
and systems. Supporters of the conference include the Defense Threat
Reduction Agency, Sandia National Laboratories, Air Force Research
Laboratory, the NASA Electronic Parts and Packaging Program, NASA
Living With a Star Program, and the Jet Propulsion Laboratory.
TECHNICAL PROGRAM
Papers to be presented at this meeting will describe the effects
of space, terrestrial or nuclear radiation on electronic or photonic
devices, circuits, sensors, materials and systems, as well as semiconductor
processing technology and techniques for producing radiation-tolerant
devices and integrated circuits. The conference will be attended
by engineers, scientists and managers who are concerned with radiation
effects. International participation in the conference is strongly
encouraged.
We are soliciting papers describing significant new findings in
the following or related areas:
Basic Mechanisms of Radiation Effects in Electronic Materials
and Devices
• Ionizing Radiation Effects
• Materials and Device Effects
• Displacement Damage
• Single-Event Charge Collection Phenomena and Mechanisms
• Radiation Transport, Energy Deposition and Dosimetry
• Processing-Induced Radiation Effects
Radiation Effects on Electronic and Photonic Devices and Circuits
• MOS, Bipolar, and Advanced Technologies
• Isolation Technologies, such as SOI and SOS
• Optoelectronic and Optical Devices and Systems
• Methods for Hardened Design and Manufacturing
• Modeling of Devices, Circuits and Systems
• Particle Detectors and Associated Electronics for High-Energy
Accelerators
• Cryogenic or High Temperature Effects
• Single-Event Effects
• Novel Device Structures, such as MEMs and Nanotechnologies
Space, Atmospheric and Terrestrial Radiation Effects
• Characterization and Modeling of Radiation Environments
• Space Weather Events and Effects
• Spacecraft Charging
Hardness Assurance Technology and Radiation Testing
• Testing Techniques, Guidelines and Hardness Assurance Methodology
• Radiation Exposure Facilities
• Dosimetry
Commercial Space Systems
New Developments of Interest to the Radiation Effects Community
RADIATION EFFECTS DATA WORKSHOP
The Radiation Effects Data Workshop is a forum for papers on radiation
effects data on electronic devices and systems. Workshop papers
are intended to provide radiation response data to scientists and
engineers who use electronic devices in a radiation environment,
and for designers of radiation-hardened or radiation-tolerant systems.
Papers describing new simulation facilities are also welcomed.
PAPER SUBMITTAL
Information on the submission of summaries to the 2006 NSREC for
either the Technical Sessions or the Data Workshop can be found
at www.nsrec.com. The deadline
for submitting summaries is February 3, 2006.
SHORT COURSE
Attendees will have the opportunity to participate in a one-day
Short Course on Monday, July 17. We are currently putting together
a short course that focuses on modeling the space radiation environment
and its effects on electronic devices and circuits. It will consist
of tutorial presentations that begin with modeling the space radiation
environment, and then moves to the simulation of basic interaction
mechanisms that are relevant for the space environment. Next, modeling
the charge transport and collection processes using technology computer-aided
design tools will be presented followed by modeling circuit level
single event effects radiation response. The course will be of interest
both to radiation effects specialists and newcomers to the field
alike.
INDUSTRIAL EXHIBIT
An Industrial Exhibit will be included as an integral part of the
conference. The exhibit will be held on Tuesday and Wednesday. It
will include exhibits from 35-40 exhibitors that represent companies
or agencies involved in manufacturing electronic devices or systems
for applications in space or nuclear environments, modeling and
analysis of radiation effects at the device and system level, and
radiation testing.
CONFERENCE COMMITTEE
General Chair
Janet Barth
NASA/GSFC
301-286-8046
Technical Program
Gary Lum
Lockheed Martin
408-756-0120
Local Arrangements
Nick van Vonno
Intersil
321-255-2791
Short Course
Robert Reed
Vanderbilt University
615-343-2702
Publicity
Teresa Farris
Aeroflex Colordo Springs
719-594-8035
Finance
Dale McMorrow
Naval Research Laboratory
202-767-5469
Awards
Paul Dodd
Sandia National Laboratories
505-844-1447
Industrial Exhibits
Richard Elmhurst
Honeywell
727-539-3209
Guest Editor
Philippe Paillet
CEA/France 33-169-26-5089
Janet Barth, Chair of the 2006 NSREC, can be reached at NASA
Goddard Space Flight Center, Code 561, Flight Data Systems and Radiation
Effects Branch, Greenbelt, MD 20771, USA; Phone +1 301 286-8046;
Fax: +1 301 286-4699; E-mail: Janet.L.Barth@nasa.gov.
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