| The
2008 IEEE Nuclear and Space Radiation Effects Conference will be
held July 14-18, 2008 in Tucson, Arizona at the newly-opened JW
Marriott Starr Pass Resort and Spa. The conference will feature
a Technical Program consisting of nine sessions of contributed papers
(both oral and poster) that describe the latest observations and
research results in radiation effects, an up-to-date Short Course
offered on July 14, a Radiation Effects Data Workshop, and an Industrial
Exhibit.
The conference hotel is located in Tucson, Arizona, west of the
downtown area and near to Gates Pass. A complete technical and social
program is being planned to maximize opportunities for information
exchange and networking in the area of radiation effects on microelectronic
and photonic devices, circuits, and systems. Supporters of the conference
include the Defense Threat Reduction Agency, Sandia National Laboratories,
Air Force Research Laboratory, the NASA Electronic Parts and Packaging
Program, NASA Living With a Star Program, Jet Propulsion Laboratory,
Aeroflex Colorado Springs, Boeing, BAE Systems, Micro-RDC, Honeywell,
ST Microelectronics and Northrup Grumman.
TECHNICAL PROGRAM
Papers to be presented at this meeting will describe the effects
of space, terrestrial or nuclear radiation on electronic or photonic
devices, circuits, sensors, materials and systems, as well as semiconductor
processing technology and techniques for producing radiation-tolerant
devices and integrated circuits. The conference will be attended
by engineers, scientists and managers who are concerned with radiation
effects. International participation in the conference is strongly
encouraged.
The conference committee is soliciting papers describing significant
new findings in the following or related areas:
Basic Mechanisms of Radiation Effects in Electronic Materials and
Devices
• Ionizing Radiation Effects
• Materials and Device Effects
• Displacement Damage
• Single-Event Charge Collection Phenomena and Mechanisms
• Radiation Transport, Energy Deposition and Dosimetry
• Processing-Induced Radiation Effects
Radiation Effects on Electronic and Photonic Devices and Circuits
• MOS, Bipolar, and Advanced Technologies
• Isolation Technologies, such as SOI and SOS
• Optoelectronic and Optical Devices and Systems
• Methods for Hardened Design and Manufacturing
• Modeling of Devices, Circuits and Systems
• Particle Detectors and Associated Electronics for High-Energy
Accelerators
• Cryogenic or High Temperature Effects
• Single-Event Effects
• Novel Device Structures, such as MEMs and Nanotechnologies
Space, Atmospheric and Terrestrial Radiation Effects
• Characterization and Modeling of Radiation Environments
• Space Weather Events and Effects
• Spacecraft Charging
• Soft Error Rates (SER)
Hardness Assurance Technology and Radiation Testing
• Testing Techniques, Guidelines and Hardness Assurance Methodology
• Radiation Exposure Facilities
• Dosimetry
Commercial Space Systems
New Developments of Interest to the Radiation Effects Community
RADIATION EFFECTS DATA WORKSHOP
The Radiation Effects Data Workshop is a forum for papers on radiation
effects data on electronic devices and systems. Workshop papers
are intended to provide radiation response data to scientists and
engineers who use electronic devices in a radiation environment,
and for designers of radiation-hardened or radiation-tolerant systems.
Papers describing new simulation facilities are also welcomed.
PAPER SUBMITTAL
Information on the submission of summaries to the 2008 NSREC for
either the Technical Sessions or the Data Workshop can be found
at www.nsrec.com. The deadline
for submitting summaries is February 1, 2008.
SHORT COURSE
Attendees will have the opportunity to participate in a one-day
Short Course on Monday, July 14. The theme for the 2008 short course
is: "Soft Errors from the Ground Up” and is being organized
by Jeff Black of the Vanderbilt University/ISDE. The course will
be of interest both to radiation effects specialists and newcomers
to the field alike.
INDUSTRIAL EXHIBIT
An Industrial Exhibit will be included as an integral part of the
conference. The exhibit will be held on Tuesday and Wednesday. It
will include exhibits from 35-40 exhibitors that represent companies
or agencies involved in manufacturing electronic devices or systems
for applications in space or nuclear environments, modeling and
analysis of radiation effects at the device and system level, and
radiation testing.
CONFERENCE COMMITTEE
General Chair
Paul E. Dodd
Sandia National Laboratories
505-844-1447
Technical Program
Nick van Vonno
Consultant/Intersil
321-255-2791
Local Arrangements
Bill Heidergott
General Dynamics
480-441-4598
Short Course
Jeff Black
Vanderbilt/ISDE
615-322-3758
Publicity
Teresa Farris
Aeroflex Colorado Springs
719-594-8035
Finance
Gary Dunham
NAVSEA Crane
812-854-6422
Awards
Mike Xapsos
NASA/GSFC
301-286-2263
Industrial Exhibits
John Jewell
Sandia National Laboratories
505-797-8846
Poster Chair
Jeff Titus
NAVSEA Crane
812-854-1617
Data Workshop Chair
Jim Felix
Sandia National Laboratories
505-844-6132
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