AWARDS

PHELPS GRANTS
Phelps Grants Awarded to Student Members
from Radiation Effects Community

The 2008 Paul Phelps Continuing Education Grant was awarded to two student members from the radiation effects community. At the opening of the NSREC technical sessions (July 2008), Tim Oldham, Chairman of the Radiation Effects Steering Group, presented both students with the grant. The grant included tuition for the 2008 NSREC Short Course and a check for $500.
The purpose of the Phelps’ Grant is to promote continuing education and encourage membership in the IEEE Nuclear and Plasma Sciences Society (NPSS).
The basis for judging is exceptional promise as a graduate student working in the fields of the NPSS, “exceptionally good work” in those fields, and an expectation that attendance at an NPSS-sponsored short course will result in an improved possibility of obtaining a job within the radiation effects community.
On behalf of the NPSS, we are proud to announce that the two recipients for the 2008 Paul Phelps Continuing Education Grant are Xiao Jie Chen and Oluwole A. Amusan.


Xiao Jie Chen

Xiao Jie Chen received his bachelors degree in Electrical and Computer Engineering from New Mexico State University, a Masters degree in Electrical and Computer Engineering from University of Arizona, and is currently pursuing his Ph.D. degree in Electrical Engineering at Arizona State University, in Tempe, Arizona, U.S.A. His main research work is on characterization and modeling of degradation mechanisms of silicon devices in harsh radiation environments, and he has authored or co-authored more than ten journal and conference papers as a student. He plans to complete his Ph.D. in August 2008. His professor, Dr. Hugh Barnaby, Associate Professor of EE, nominated him.


Oluwole A. Amusan

Oluwole A. Amusan (S’02) received his B.S. degree in Electrical and Electronics Engineering from Alabama A&M University in Huntsville, AL in 2003 and the M.S. degree in Electrical Engineering from Vanderbilt University, Nashville, TN in 2006. He is currently working on his Ph.D. degree in Electrical Engineering at Vanderbilt University, Nashville, TN. His research interests include microelectronic circuit analysis and design, effects of radiation on integrated circuits, specifically designing for radiation hardness, technology CAD modeling of CMOS devices, and modeling circuit-level soft errors. He has authored or co-authored more than thirteen journal and conference papers as a student. He plans to complete his Ph.D. in August 2008. His professor, Dr. Lloyd W. Massengill Professor of EECS, nominated him.


Marty Shaneyfelt Radiation Effects Member-at-Large

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 


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