Mr. van Vonno received his Bachelor of Science degree in electrical engineering from the University of Florida in 1966. He joined Harris Semiconductor as a reliability engineer, device engineer and supervisor and in 1982 was promoted to Director, Analog Product Development. In 1994, Mr. van Vonno was promoted to Senior Scientist, with responsibilities in radiation effects in electronics, technology development and advanced projects. In the 1996-1997 timeframe, he led the development of an innovative direct fingerprint sensor using RF field technology. This project culminated in the successful spinoff of Authentec, Incorporated from Harris Semiconductor. Mr. Van Vonno retired from Intersil Corporation as an Intersil Fellow.
Mr. van Vonno has participated in a wide range of professional activities including IEEE and international conference functions. He has been an active participant in the IEEE Nuclear and Space Radiation Effects Conference (NSREC), serving as Poster Session Chair (1988), Guest Editor (1990, 1991, and 1992), Session Chair (1993), Awards Chair (1994), Short Course speaker (1995), Short Course Chair (1997), Local Arrangements Chair (2006), and Technical Program Chairman (2008). He served on the Radiation Effects Steering Group as Member at Large (1998-2001), and Vice Chair for Publications (2001-2004). He has also served as a reviewer and session chairman for the European Conference on Radiation and its Effects on Components and Systems (RADECS) and the Hardened Electronics and Radiation Technology (HEART) conference and will be Chairman, Data Workshop for RADECS-2010. Mr. van Vonno holds 16 United States patents in the areas of silicon processing, optics, packaging and biometric sensing. He has over thirty publications and conference presentations and is a Senior Member of IEEE.
His citation reads: For contributions to the design, development, and manufacture of radiation-hardened integrated circuits that have been used in critical space and defense systems. |
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