14 - 16
July 2003

Fairmont Waterfront

Vancouver

British Columbia

CANADA

Session Information

Scope: Recent developments in high stability, short pulse (< 10 fs) mode-locked lasers and broadband nonlinear optical-frequency generation techniques have led to a convergence of the fields of frequency metrology, ultrafast optics and microwave photonics. For the first time, it is possible to directly transfer the frequency stability of a microwave clock to an optical standard and vice versa. Recent advances in optical frequency metrology using femtosecond laser generated combs will be presented by T. Udem (Max-Planck Institute for Quantum Optics) and H. Margolis (NPL); use of this technology for optical atomic clocks will be discussed by J. Bergquist (NIST). The current limitations on femtosecond comb technology will be discussed by S. Diddams (NIST) and K. Williams (NRL). The recent development of octave spanning Ti:sapphire lasers, which can generate femtosecond combs without use of external spectral broadening, will be presented by T. Fortier (JILA) and F. Kärtner (MIT). In the area of applied photonic sources, K Weingarten (GigaTera) will review issues surrounding the current limitations related to timing jitter in pulsed lasers. RF frequency and waveform generation will be covered by A. Matsko (JPL) and T. Nagatsuma (NTT). Comparison of these technologies to existing RF techniques will be presented by E. Ivanov (UWA). The state-of-the-art in photonic analog to digital conversion will be presented by B. Jalali (UCLA) and R. Williamson (MIT/LL). Others will present recent results on related topics in ultrafast optic, microwave photonics and optical frequency metrology.

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Committee

Chi Lee, Chair
University of Maryland, College Park, MD, USA

Steve Cundiff, Co-chair
JILA/University of Colorado, Boulder, CO, USA

Paul Juodawlkis, Co-chair
MIT Lincoln Lab, Lexington, MA, USA

Peter J. Delfyett

School of Optics, Orlando, FL  USA

 

Leo Hollberg

NIST, Boulder, CO, USA

 

Ursula Keller

Swiss Federal Institute of Technology, Zurich, SWITZERLAND

 

Brian Kolner

University of California - Davis, Davis, CA  USA

 

Alan Madej

National Research Council, Institute for National Measurement Standards, Ottawa, Ontario, CANADA

 

Motoichi Ohrsu

Tokyo Institute of Technology, Yokohama, Kanagawa, JAPAN

 

Alwyn Seeds

University College London, London, UK

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