Jacob A. Abraham

Dr. Jacob A. Abraham, a professor of computer engineering at the University of Texas at Austin, is a world leader in computer engineering who has made several major contributions to the testing and fault-tolerance fields. His work in the functional testing of microprocessors has become integral to the testing of complex digital designs. The algorithm-based fault tolerance (ABFT) technique he invented while at the University of Illinois at Urbana-Champaign is now standard practice for providing application-level fault tolerance in many space-borne applications. At the University of Texas he has developed a hierarchical test generation method that significantly improved test generation time and test quality for complex chips. The native-mode self-test method he developed is being used by the Intel Corporation to improve tests for the Pentium 4 processor.

He is a Fellow of both the IEEE and the Association for Computing Machinery, and has published more than 300 papers.