Electron Devices Society Videotape Lending Library Program
As many of you are aware, the International Electron Devices Meeting (IEDM) holds two short courses each year. These courses are videotaped and later made available for sale through IEEE. Each course is included on four tapes and runs approximately 7-8 hours. Currently, thirty short courses have been videotaped covering the meeting years 1987-2003.
In 1994, the Electron Devices Society announced the establishment of a lending library for its chapters which contains the videotapes of all thirty IEDM short courses. The EDS Executive Office maintains the library and fulfills all chapter requests for the tapes which are available in both NTSC and PAL formats. The purpose of this program is to provide an additional means by which a chapter can hold a meeting without having to invite a speaker, as well as make available to EDS members the educational material contained in the IEDM short courses.
Since the start of the library, many other IEEE and EDS produced videotapes were added to the library. In 2002, EDS celebrated its 50th Anniversary and a '50 Years in 50 Minutes' talk was given by Richard True, Jim Early, Lew Terman and Jerry Woodall in honor of this event. The talk is available on DVD and videotape and can be borrowed by EDS Chapters.
A chapter is only allowed to borrow one course at a time and each course must be returned to the EDS Executive Office approximately six weeks from its date of receipt. The course tapes must not be duplicated by the chapter.
Below is a list of the videotape short courses broken down by the year of the IEDM, followed by a listing of other tapes available through the library. If you would like a description of the courses or to borrow an IEDM course for one of your chapter meetings, please contact Laura Riello of the EDS Executive Office using the information provided below.
EDS Executive Office
445 Hoes Lane
Piscataway, NJ 08854
Phone: +1 732-562-3927
Fax: +1 732 235 1626
Email: l.riello@ieee.org
We hope that the EDS chapters will take advantage of the availability of these courses.
I. 1987 IEDM
A. BiCMOS Technology and Design Techniques
B. GaAs Monolithic Microwave Integrated Circuits (MMIC)
II. 1988 IEDM
A. Heterostructure Transistors
B. Memories and Microprocessors
III. 1989 IEDM
A. Digital Signal Processing
B. MBE and MOCVD - New Structures and Devices
IV. 1990 IEDM
A. Non-Volatile Memory Technologies
B. Silicon-On-Insulator
V. 1991 IEDM
A. Bipolar Technology For BiCMOS VLSI
B. Semiconductor Manufacturing
VI. 1992 IEDM
A. Interconnect for the 90s
B. Reliability - Silicon to Systems Considerations
VII. 1993 IEDM
A. Advanced Silicon Processing Techniques For Device Engineers
B. Low Voltage/Low Power Devices
VIII. 1994 IEDM
A. Mixed Signal IC Technologies and Design
B. Advanced Device Characterization and Test Methodologies
IX. 1995 IEDM
A. NVRAM Technology and Applications
B. Technologies for Portable Systems
X. 1996 IEDM:
A. The Back End at the Forefront
B. DRAMs in the 21st Century
XI. 1997 IEDM
A. Giga-Scale CMOS Technology
B. Trends in RF Devices and ICS for Wireless Applications
XII. 1998 IEDM
A. Reliability for Logic & Memory Technologies
B. Next-Generation TCAD: Models & Methods
XIII. 1999 IEDM
A. Sub-100NM CMOS
B. System-on-a-Chip
XIV. 2000 IEDM
A. Advanced Interconnects: Design, Process, and Integration
B. Technology for the Internet Era
XV 2001 IEDM
A. Process & Device Technology for Sub-70 nm CMOS
B. Advanced Memory Technology and Architecture
XVI 2002 IEDM
A. RF Device Technologies for Communication Systems
B. The Future of Semiconductor Manufacturing
XVII 2003 IEDM
A. Interconnect Scaling: From Technology & System Design
B. Silicon +: Augmented Silicon Technology
OTHER VIDEOTAPES AVAILABLE THROUGH THE EDS LIBRARY
I. General
A. EDS 50th Anniversary Talk Entitled '50 Years in 50 Minutes'
Given at the IEDM in San Franciscon, CA in December 2002
Topic: Presented by:
In the Beginning: Electron Tubes Richard True
Bipolar Transistors Arrive James Early
MOS Leads IC's Lew Terman
Heterostructures Give New Structure Jerry WoodallB. The Entrepreneurial Skills Seminar
This series consists of six videotapes and a supporting information booklet which have been prepared
to convey the concepts, risks and advantages of entrepreneurial endeavors.C. Vision 21
If you are concerned about membership growth, meeting attendance, or apathy, this 25 minute video
provides answers.
II. Student/Young Engineer Videos Appropriate for the STAR Program
A. Getting Ready: Careers for Electrical Engineers and Computer Scientists
This is a 25 minute video on education and career advice for students, which has been developed by
the IEEE Educational Activities.B. What's Out There: Careers for Electrical Engineers and Computer Scientists
This is a 28-minute video focusing on what engineers and computer professionals actually do, which
has been developed by the IEEE Educational Activities Department.C. Engineering & Technology Opportunities for all #2
A series of short videos concerning students/young engineers looking to pursue careers in engineering with titles as follows:
_ Dream Your Own Dream - No Description Available
_ Designing The Future - No Description Available
_ Engineering: A Career for Women - No Description Available
_ The Dream Begins With You - No Description Available
_ Women in Engineering - No Description AvailableD. Who Are Engineers? You?
This video introduces students to engineering as they meet a diverse group of engineers working medical technology, energy production, and more. Tape runs 12 minutes. For grades 6-12.Engineers: Turning Ideas Into Reality
This is a popular 8 minute video designed to introduce junior and senior high school students to a
variety of engineering challenges and rewards. For grades 7-12.Bikes
This video teaches students about engineering through something they appreciate: bicycles. The
story of the engineering team is told through bike racing and manufacturing. Tape runs 8 minutes. For grades 5-9.E. Women & Girls in Education: What's Working in Schools and Communities
No description available
III. EDS Independent Short Courses Held in 2000
A. Circuit Design and Technology for RF-CMOS
Held, 27 July 2000 and presented by Dr. Asad Abidi, University of California, Los Angeles. Starting from fundamental concepts, the course will develop an understanding of how tuned amplifiers, mixers and oscillators work. It will present state of the art circuit design techniques, which show the limits to performance imposed by transistor technology. Using newly developed models for noise in mixers and oscillators, the relation of power dissipation to RF performance will be explained. The interaction of integrated spiral inductors with the silicon substrate will be discussed.B. Overview of Fiber Optic Communications
Held, 11 October 2000 and presented by Dr. Joe C. Campbell, University of Texas at Austin. This video will provide an overview of key optoelectronic devices for optical communication systems, specifically, semiconductor lasers, photodetectors, optical modulators and WDM components.
C. Using Modeling To Resolve Design and Reliability Issues
Held, 19 October 2000 and presented by Dr. Sanjay Banerjee, University of Texas at Austin. The video will provide an overview of MOS and bipolar devices, circuit models and reliability physics. The course will describe the operation and design issues of Si integrated circuits, point out applications and discuss the process integration, reliability and testing issues
IV. Reliability Society Short Courses Held in 2000
A. MEMS Performance & Reliability
Presented by: Paul McWorter, Samuel L. Miller and William M. Miller; Sandia National Laboratories; technically edited by Tim Rost, Texas
This video tutorial focuses on silicon microelectromechanical systems (MEMS) performance and reliability. This video covers how to make valid performance and reliability measurements and their relationship to some specific design issues, addressing design, performance and reliability of MEMS together. It provides a brief overview of silicon-based technologies for those unfamiliar with the field. Both silicon actuators and sensors are addressed. Three professionals, along with a panel of experts, cover developments in this growing field. In the panel discussion, MEMS experts discuss the history and future of challenges and opportunities in the MEMS area from industry, university, and government perspectives. This set also includes four related IEEE Conference proceeding excerpts, and other reference materials on a CD ROM. A CEU exam is also included.Experience with traditional CMOS fabrication technologies would be an asset, but is not strictly required to understand this material. This video will interest reliability, technology, designer, and product engineers and managers.
B. Oxide Wearout, Breakdown & Reliability
Presented by: David J. Dumin, Clemson University; technically edited by Tim Rost, Texas Instruments
Topics Covered Include: Brief history on Oxide Wearout; Models for Wearout & Breakdown; Characterization of Wearout Physics, Measurement, and Consequences of Trap Generation; Properties of the Stress Generated Traps; Coupling of Trap Generation to Breakdown; Differences between early electrical Breakdowns and Final, Thermal Breakdown
