Richard Blish received a B.S. in Physics (1963) and a Ph.D. in Materials Science (1967) from the California Institute of Technology. He spent 1967-69 at Bell Labs correlating electrical properties of diode arrays to crystalline damage detected by X-ray topography. 1969-80 were at Signetics, working on XRF, SEM, microprobe, metallography, chromatography and plasma etching. 1980-94 were at Intel in a variety of management roles in Package Reliability. 1995 to present have been at AMD, currently as an AMD Fellow in Reliability Engineering. Rich has 18 patents (24 pending) and 20 publications, winning awards for paper quality at IRPS & ECTC. Rich is a past General Chair and Chairman of the Board of IRPS & chaired the SEMATECH RTAB for 2000.