James A. Walls received the B.Sc. Honours Degree in Electronics and Physics from the University of Edinburgh, Scotland in 1986. He received the Ph.D. Degree in Microelectronics from the Edinburgh Microfabrication Facility at the University of Edinburgh in 1990, for his work on the application of Artificial Intelligence techniques to the interpretation and control of semiconductor capacitance-voltage measurements. He has managed the Motorola Mesa Reliability Physics and Development Laboratory since 1997, and in 2000 relocated to the DigitalDNA Labs in Chandler. His current areas of focus are the evaluation of new materials as well as Intrinsic Reliability test methods development for new technologies, including highly-accelerated testing.

Dr. Walls is a Senior Member of the IEEE Electron Devices Society.