Transactions on Device and Materials Reliability (T-DMR) Editorial Board
|
||||||||
 |
 |
 |
||||||
| Richard Blish Spansion Quality & Reliability Eng 915 De Guigne, Mail Stop 33 Sunnyvale, CA 94088-3453 USA Tel: +1 408 616 6788 Fax: +1 408 616 8174 E-Mail: richard.blish@amd.com |
Aris Christou University of Maryland Dept. of Materials Science and Eng College Park, MD 20742-2115, USA Tel: +1 301 405 5208 Fax: +1 301 314 2029 E-Mail: christou@eng.umd.edu
|
Charvaka Duvvury Texas Instruments Inc. MS 3737, PO Box 650311 13560 North Central Expressway Dallas, TX 75243, USA Tel: +1 972 995 7988 Fax: +1 972 995 2770 E-Mail: c-duvvury@ti.com |
||||||
 |
 |
 |
||||||
| Fausto Fantini Univ. Studi di Modena e Reggio Emilia Dipt . di Scienze dell'Ingegneria Via Vignolese 905 41100 Modena,Italy Tel: +39 059 2056 165 Fax : +39 059 2056 129 E-Mail: fausto.fantini@unimo.it |
Paul S. Ho University of Texas at Austin Center for Materials Sci and Eng Prc Intercon & Pkg Grp,MS R8650 Austin, TX 78712, USA Tel: +1 512 471 8961 Fax: +1 512 471 8969 E-Mail: paulho@mail.utexas.edu |
Arokia Nathan London Center for Nanotechnology University College London London WC1H 0AH United Kingdom Tel: +44 (0)20-7679 2367 Fax: +44 (0)20-7679 0595 E-Mail: anathan@ucl.ac.uk http://www.lcn.ucl.ac.uk/United Kingdom |
||||||
 |
 |
 |
||||||
| Elyse Rosenbaum University of Illinois at Urbana-Champaign 1308 W. Main St. Urbana, IL 61801, USA Tel: +1 217 333 6754 Fax: +1 217 244 1946 E-Mail: elyse@uiuc.edu |
Gay Samuelson Consultant 8848 East Jack Neville Dr. Scottsdale, AZ 85262, USA Tel: +1 480 595-8217 E-Mail: g.m.samuelson@att.net |
James A. Walls Freescale TSO Reliability Lab 1300 N. Alma School Rd. M/S AZ50/CH410 Chandler, AZ 85224, USA Tel: +1 480 814 5508 Fax: +1 480 814 4834 E-Mail: james.walls@freescale.com |
||||||
 |
||||||||
|
Peter J. S. Yuan |
||||||||
