Skip Navigation
Join IEEE
 
 

Home  >  Conferences  >  Conference Details

2018 IEEE International Test Conference (ITC)

IEEE sponsors:

  • Philadelphia Section

International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification and validation, test (DFT, ATPG, and BIST), diagnosis, failure analysis and back to process, yield, reliability and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

 

Conference Details

Dates

30 Oct - 03 Nov 2018

 

Location

Phoenix Convention Center
100 N. 3rd St.
Phoenix, AZ, USA

 

Web site

 

Contact

Li-C Wang
Department of ECE, UCSB
Santa Barbara CA USA 93106-9560
+1 805-886-6017
licwang@ece.ucsb.edu

 

Conference #

41524

 

Attendance

1100

 

 

Please see the conference Web site for full details.

Call for Papers for Conference Authors

Find details for paper and abstract submission.

Abstract submission deadline: 09 Mar 2018

Full Paper Submission deadline: 23 Mar 2017

Final submission deadline: 20 Jul 2018

Notification of acceptance date: 01 Jun 2018

 

 

Features

  • Exhibits
  • Tutorials