EDS DISTINGUISHED LECTURER PROGRAM - LECTURERS RESIDING IN ASIA & PACIFIC
EDS DISTINGUISHED LECTURER PROGRAM - LECTURERS RESIDING IN ASIA & PACIFIC The EDS Distinguished Lecturer Program exists for the purpose of providing EDS Chapters with a list of quality lecturers who can potentially give talks at local chapter meetings. To arrange for a lecture, the EDS chapters should contact the Distinguished Lecturer directly. A general guideline for the visit, but not the absolute rule, is that the lecturer should be able to include the meeting site with an already planned travel schedule at a small incremental cost to the travel plan. Alternatively, a prior coincident travel plan would not be required if the lecturer is already located within an approximate fifty mile radius of a meeting site. Although the concept of the program is to have the lecturers minimize travel costs by combining their visits with planned business trips, EDS will help subsidize lecturer travel in cases where few/no lecturers will be visiting an area and/or a chapter cannot pay for all the expenses for a lecturer trip. For a full listing of EDS Distinguished Lecturers and travel plans please contact Laura Riello of the EDS Executive Office (Tel: 1-732-562-3927, Fax: 1-732-235-1626, E-Mail: l.riello@ieee.org).
| SHOJIRO
ASAI Tel: +81 3 3214 3101 Fax: +81 3 3214 3025 E-Mail: s.asai@ieee.org -Microelectronic Challenges - Microscopic Frontiers in Macroscopic Perspective |
HIROYUKI
MATSUNAMI Tel: +81 75 7535340 Fax: +81 75 7535342 E-Mail: matsunam@kuee.kyoto-u.ac.jp |
| SIMA
DIMITRIJEV Tel: +61 7 3875 5068 Fax: +61 7 3875 5198 E-Mail: s.dimitrijev@me.gu.edu.au -Development of Gate Oxides on SIC -Issues and Trends in Microelectric Education |
TADASHI
NISHIMURA Tel: +81 727 84 7301 Fax: +81 727 80 2685 E-Mail: nisimurt@lsi.melco.co.jp |
| MASAO
FUKUMA Tel: +81 42 771 0621 Fax: +81 42 771 0897 E-Mail: m.fukuma@ieee.org -Device Technology for sub-100nm VLSIs -New Architecture and Circuits for Low Power and High Performance Processors |
HIROSHI
NOZAWA Tel: +81 75 753 4725 Fax: +81 75 753 4725 E-Mail: nozawa@vega.energy.kyoto-u.ac.jp -Reliability Physics of Semiconductor Memory Devices -Memory Based Parallel Data Processing -Applications of Ferroelectric RAM for Logic Devices -Modeling of Tunnel Oxide Current in Island Structure |
| KEN-ICHI
GOTO Tel: +81 462 50 8246 Fax: +81 462 50 8804 E-Mail: kgoto@flab.fujitsu.co.jp -High Performance Sub-100nm CMOS Technology -Laser Thermal Process for Ultra -Low Contact Resistance -Decaborane Ion Implantation Technology for Shallow Junction -Co Salicide Process and CoSix Spike Leakage Mechanism |
YASUHISA
OMURA Tel: +81 6 6368 0825 Fax: +81 6 6388 8843 E-Mail: omuray@ipcku.kansai-u.ac.jp -Quantum Mechanical Short-Channel Effects in Scaled SOI MOSFETs and Design Issues -SOI Insulated-Gate pn-Junction Devices: Operations, Performance and Applications -Ultimate SOI Device Structures: Is Double-Gate SOI Device Truly an Ultimate Structure |
| MARTIN
A. GREEN Tel: +61 2 9385 4018 Fax: +61 2 9662 4240 E-Mail: m.green@unsw.edu.au -Photovoltaic Devices and Systems -High Efficiency Silicon Solar Cells -Low Cost Silicon Solar Cells -Future Applications of Solar Cells |
RADIVOJE
POPOVIC Tel: + 41 21 693 38 53 Fax: + 41 21 693 66 70 E-Mail: radivoje.popovic@epfl.ch -Bridging the Gap Between Magnetoresistors and Hall Magnetic Sensors -Integrated Hall Sensor/Flux Conventional CMOS Technology -Avalanche Photodiode in Conventional CMOS Technology |
| YOSHIAKI
HAGIWARA Tel: +81 3 5435 3610 Fax: +81 3 5435 3803 E-Mail: yoshiaki.hagiwara@jp.sony.com -Electronics For Home Entertainments -VLSI Technology Behind Digital Consumer Appliances -Introduction to Physics of Semiconductor Devices (Please see http://www.ssdp.caltech.edu/aphee183/) -Measurement Technology for Home Entertainment LSI Chips |
M.K.
RADHAKRISHNAN Tel: +65 3579363 Fax: +65 3858821 E-Mail: radhakrishnan@ieee.org -Physical Analysis of Ultra Thin Gate Oxide Breakdown -Building in Reliability and Failure in Analysis Challenges in Sub-Micron Devices -Failure Mechanism Study of Sub-Micron Devices -ESD Induced Failures in Devices and the Analysis |
| LIANG-KAI
“KEVIN” HAN Tel: +886 3 5781688 x4794 Fax: +886 3 5797310 E-Mail: lkhan@tsmc.com.tw |
CHANDAN
KUMAR SARKAR Tel: +91 33 483 2304 Fax: +91 33 473 2217 E-Mail: phyod@yahoo.co.in |
|
TAKEO HATTORI |
S.C.
SUN Tel: +86 360 1818 Fax: +86 362 2937 E-Mail: s.sun@ieee.org -CVD and PVD Transition Metal Nitrides Diffusion Barriers for Copper Metallization -RTCVD of Nitrogen Doped Polysilicon for Dual Gate CMOS Applications |
| HIROSHI
ISHIWARA Tel: +81 45 921 5040 Fax: +81 45 924 5961 E-Mail: ishiwara@pi.titech.ac.jp -Ferroelectric Random Access Memories -Si-Based Heteroepitaxial Devices |
KUNIO
TADA Tel: +81 45 339 4274 Fax: +81 45 338 1157 E-Mail: k.tada@ieee.org -New Semiconductor Photonic Devices for Optical Communication and Photonic Switching |
| HIROSHI
IWAI Tel: +81 45 924 5471 Fax: +81 45 924 5584 E-Mail: h.iwai@ieee.org -Silicon MOSFET Scaling Beyond 0.1 Micron |
HIDEMI
TAKASU Tel: +81 75 311 2111 Fax: +81 75 321 6256 E-Mail: hidemi.takasu@dsn.rohm.co.jp -Ferroelectric Memory Technology (Process & Device) and It’s Application |
| CHENNUPATI
JAGADISH Tel: +61 2 6125 0363 Fax: +61 2 6125 0511 E-Mail: c.jagadish@ieee.org -Quantum Well Intermixing for Optoelectronic Device Integration -Quantum Well Infared Photodetectors -High Power Semiconductor Lasers |
KENJI
TANIGUCHI Tel: +81 6 6879 7791 Fax: +81 6 6879 7792 E-Mail: taniguti@eie.eng.osaka-u.ac.jp |
| MASAAKI
KUZUHARA Tel: +81 77 537 7687 Fax: +81 77 537 7689 E-Mail: kuzuhara@bu.jp.nec.com -Power GaAs Heterojunction FET with a Field Plate -GaN- Based Heterojunction FET for High-Power Applications |
KAZUO
TSUBOUCHI Tel: +81 22 217 5530 Fax: +81 22 217 5533 E-Mail: tsubo@riec.tohoku.ac.jp -LSI Design for Wireless Communications -Current Mode Analog Circuit for Low Power Signal Processing |
| OH-KYONG
KWON Tel: +82 2 2290 0359 Fax: +82 2 2297 7701 E-Mail: okwon7@chollian.net -High Voltage Devices and Ics for Smart Power Applications -Driving Methods and Circuits for Flat Panel Displays -Signal Integrity of Very High-Speed VLSI Systems |
DAISUKE
UEDA Tel: +81 726 82 7802 Fax: +81 726 82 7738 E-Mail: daisuke@ieee.org -Compound Semiconductor Devices and Circuits |
| JACK
LAU Tel: +852 2358 7043 Fax: +852 2358 1485 E-Mail: eejlau@ee.ust.hk |
JUZER
M. VASI Tel: +91 22 5722545 Fax: +91 22 5723707 E-Mail: vasi@ee.iitb.ac.in -Reliability of MOS Transistors with High-K Dielectrics -SOI MOSFETS for Analog Applications |
| KEI
MAY LAU Tel: +852 2358 7049 Fax: +852 2358 1485 E-Mail: eekmlau@ust.hk |
HISATSUNE
WATANABE Tel: +81 44 856 2009 Fax: +81 44 951 2080 E-Mail: watanabe@ab.jp.nec.com -Development of Advanced Semiconductor Technology |
| KWYRO
LEE Tel: +82 42 869 3433 Fax: +82 42 869 8590 E-Mail: kwyro.lee@ieee.org -RF CMOS Device Modeling -Polylithic Integration of Electro-Acoustic RF Circuits Using QoS (Quartz on Silicon) -Technology for True Single Chip Radio |
YUU
WATANABE Tel: +81 44 754 2690 Fax: +81 44 754 2691 E-Mail: yuu.watanabe@jp.fujitsu.com -Compound Semiconductor Devices and Circuits |
| MIKE
MYUNG-OK LEE Tel: +82 613 330 3195 Fax: +82 613 330 2909 E-Mail: mikelee@hichips.com -High Speed and Lower Power on CMOS Design: Processes to System Architecture -High Performances for Deep Submicron CMOS/SOI Technology -Modeling for CMOS Devices and Circuits -Fundamentals to HCI Mechanism, Measurement and Modelings -VLSI/ULSI Implementation for ATM and CDMA Systems -Understanding of Submicron ESD and Failure Mechanism -Design of iMEMS Chip with Wise Sensor for Automobile, Medical & Aerospace Applications -Low Power Communication Circuits and Systems (MPEG or ADSL, etc.) for Multimedia Use -Low Power Mixed-Mode Circuits for RISC and/or DSP Core |
JAMES
S. WILLIAMS Tel: +61 6 249 0020 Fax: +61 6 249 0511 E-Mail: eme@rsphysse.anu.edu.au -Ion Implantation Processing Issues for Compound Semiconductors -Gettering of Metals to Cavities: Device Prospects -Implantation Processing of Gallium Nitride |
| CHOON-LEONG
LOU Tel: +886 3 5910178 ext. 201 Fax: +886 3 5910210 E-Mail: lou_choon_leong@ieee.org -Semiconductor Parametric Instrumentation and Systems -Semiconductor Device Characterization and Parametrics -Semiconductor Device Reliability -Advanced Semiconductor Device Characterization |
NAOKI
YOKOYAMA Tel: +81 46 250 8817 Fax: +81 46 250 8844 E-Mail: nyoko@flab.fujitsu.co.jp -Nanotechnology |
| ANTONIO
LUQUE Tel: +3491 5441060 Fax: +3491 5446341 E-Mail: luque@ies-def.upm.es -Photovoltaic Concentration, Physics and Engineering -A Renewable Energy Scenario for the XXI Century |
XING ZHOU |
| KAZUYA
MASU Tel: +81 45 924 5022 Fax: +81 45 924 5022 E-Mail: masu@ieee.org -GHz Interconnect Design in VLSI -Global Integration Technology |