The IEEE Resource Centers contain valuable, peer-reviewed technical content from reputable experts to enhance research or industry work, implement trainings, or earn CEU/PDH credits--all of which is universally available on demand. 

IEEE Resource Centers benefits include:

  • Access to valuable IEEE Society and technical community content
  • Access to content 24 hours a day, 7 days a week through an easy-to-use global portal
  • Valuable, peer-reviewed technical products available at little or no cost
  • Opportunities to earn CEUs and PDHs
  • Enhanced value of IEEE Society membership

Prior to the establishment of the IEEE Resource Centers, many IEEE members, industry experts, and the global technical community at large did not have easy access to this valuable technical content. Now, all of this valuable content is accessible to everyone through the IEEE Resource Centers. 

Find a resource

Easily search thousands of resources including webinars, white papers, slide decks, presentations, tutorials, short courses, technical panel sessions, interviews, and distinguished lectures from your particular Resource Center.

 

Find your Resource Center for even more resources in your field

Resources are published through topic-specific Resource Centers and hosted through specific IEEE Societies and technical communities. Through the Resource Centers, IEEE enables anyone access to content with an easy-to-use global portal. IEEE members get discounts on many resources and Society members get almost all resources from their Resource Center for free. Find your Resource Center and join a Society if you are looking for a cost-effective way to secure a large set of on-demand educational materials in your technical area.
 
 
NERC and IEEE are working together to proactively explore and better understand the implications of potential low fault current and short circuit strength conditions on the BPS. This report covers the various aspects of low fault current conditions and how to accommodate a changing resource mix, with the goal of identifying solutions to these potential conditions to better equip utility engineers in the future.
 

Modern Grid Design Standards Driving
Smart Grid Implementation

This course is aimed at practitioners in the construction industry, regulators, and contractors who want to understand the impact on grid modernization of electrification, renewables, and other changes happening to the environment that the electric grid supports. Discussion will include the history of how the current design standards (and drawings) were arrived at, the changes in issues and their direct impact on design standards, and recommendations for updating those standards.

 


 
Epilepsy detection and treatment can be challenging, especially for infants/children, necessitating the development of a personalized symptom detection device. Learn more about the design strategies of a patient-specific epilepsy detection System-on-Chip (SoC), including the difficulties and potential solutions to wearable interface circuit design.

Low-cost training for your organization

Add extensive training to your institution without adding overhead. IEEE provides custom, complete, end-to-end training programs for organizations, subscriptions to all content in a Resource Center, or subscriptions to subsets of technical courses to strengthen and educate your organization. 

The IEEE Resource Centers provide:

  • Fully customized training for a team, department, college, or an entire organization
  • Unlimited access to all on-demand resources in an IEEE Society
  • Educational credit opportunities for working engineers to maintain their licenses

 

Earn CEU and PDH credits

Educational credits are required in many industries to earn and maintain professional licenses and/or certifications. Earn your required CEUs or PDHs through valuable training resources that will bring you up-to-date on the latest technology and best practices. These courses provide documented CEU and PDH educational credits that can be shared with your institution and management.